CSEP Minutes 01-23-2019: Difference between revisions
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Created page with "CSEP Working Group Home Page<br><br> ''Participants'': D. Jackson, M. Werner, W. Savran, J. Gilchrest, D. Rhoades, and P. Maechling '''Minutes:''' * P..." |
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* Need to correct KS critical value computation for discrete distributions. | * Need to correct KS critical value computation for discrete distributions. | ||
* Try binning data before computing ECDF. | * Try binning data before computing ECDF. | ||
* | * Distinction between two-types of tests: | ||
** Operational Tests: Used to communicate model results. | ** Operational Tests: Used to communicate model results. | ||
** Developmental Tests: More severe tests used to aid in model development. | ** Developmental Tests: More severe tests used to aid in model development. | ||
*** Cumulative N-test visualization. | |||
*** M-test visualization with error bars around binned data. | |||
* Important to understand the deficiencies of the catalog, ie the data are of limited accuracy. | * Important to understand the deficiencies of the catalog, ie the data are of limited accuracy. | ||
Latest revision as of 19:56, 24 January 2019
Participants: D. Jackson, M. Werner, W. Savran, J. Gilchrest, D. Rhoades, and P. Maechling
Minutes:
- Presented M-test notes here: https://github.com/SCECcode/csep2/blob/master/notes/m_test_notes.ipynb
- Need to correct KS critical value computation for discrete distributions.
- Try binning data before computing ECDF.
- Distinction between two-types of tests:
- Operational Tests: Used to communicate model results.
- Developmental Tests: More severe tests used to aid in model development.
- Cumulative N-test visualization.
- M-test visualization with error bars around binned data.
- Important to understand the deficiencies of the catalog, ie the data are of limited accuracy.
