CSEP Minutes 01-23-2019
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Jump to navigationJump to searchParticipants: D. Jackson, M. Werner, W. Savran, J. Gilchrest, D. Rhoades, and P. Maechling
Minutes:
- Presented M-test notes here: https://github.com/SCECcode/csep2/blob/master/notes/m_test_notes.ipynb
- Need to correct KS critical value computation for discrete distributions.
- Try binning data before computing ECDF.
- Distinction between two-types of tests:
- Operational Tests: Used to communicate model results.
- Developmental Tests: More severe tests used to aid in model development.
- Cumulative N-test visualization.
- M-test visualization with error bars around binned data.
- Important to understand the deficiencies of the catalog, ie the data are of limited accuracy.